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Effect of p-GaN layer doping on the photoresponse of GaN-based p-i-n ultraviolet photodetectors

机译:P-GaN层掺杂对GaN的P-I-N紫外光探测器光响应的影响

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We report on two-dimensional (2D) numerical simulations of photoresponse characteristics for GaN based p-i-n ultraviolet (UV) photodetectors. Effects of doping density of p-GaN layer on the photoresponse have been investigated. In order to accurately simulate the device performance, the theoretical calculation includes doping-dependent mobility degradation by Arora model and high field saturation model. Theoretical modeling shows that the doping density of p-GaN layer can significantly affect the photoresponse of GaN based p-i-n UV photodetectors, especially at schottky contact. We have to make a suitable choice of the doping in the device design according to the simulation results.
机译:我们报告了基于GaN的P-I-N紫外(UV)光电探测器的光响应特性的二维(2D)数值模拟。研究了P-GaN层掺杂密度对光响应的影响。为了准确模拟器件性能,理论计算包括诸如arora模型和高场饱和模型的掺杂依赖的迁移率劣化。理论建模表明,P-GaN层的掺杂密度可以显着影响GaN基P-I-N紫外光探测器的光响应,特别是在肖特基触点处。我们必须根据仿真结果制作在设备设计中的掺杂选择。

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