首页> 外文会议>2015 International Conference on Optical Instruments and Technology: Optical Sensors and Applications >Effect of p-GaN layer doping on the photoresponse of GaN-based p-i-n ultraviolet photodetectors
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Effect of p-GaN layer doping on the photoresponse of GaN-based p-i-n ultraviolet photodetectors

机译:p-GaN层掺杂对GaN基p-i-n紫外光电探测器的光响应的影响

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摘要

We report on two-dimensional (2D) numerical simulations of photoresponse characteristics for GaN based p-i-n ultraviolet (UV) photodetectors. Effects of doping density of p-GaN layer on the photoresponse have been investigated. In order to accurately simulate the device performance, the theoretical calculation includes doping-dependent mobility degradation by Arora model and high field saturation model. Theoretical modeling shows that the doping density of p-GaN layer can significantly affect the photoresponse of GaN based p-i-n UV photodetectors, especially at schottky contact. We have to make a suitable choice of the doping in the device design according to the simulation results.
机译:我们报告基于GaN的p-i-n紫外线(UV)光电探测器的光响应特性的二维(2D)数值模拟。研究了p-GaN层的掺杂密度对光响应的影响。为了准确地模拟器件性能,理论计算包括Arora模型和高场饱和模型对掺杂相关的迁移率的影响。理论模型表明,p-GaN层的掺杂密度会显着影响GaN基p-i-n紫外光电探测器的光响应,特别是在肖特基接触时。我们必须根据仿真结果在器件设计中对掺杂进行适当选择。

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