Reflective X-Ray Pole Figure Measurement for Bacon Anisotropy and Orientation Factors in Polycrystalline Graphite

摘要

This paper presents pole figures measurement with reflective X-ray diffraction (XRD) technique and quantitative textural data analysis for different graphite grades. Although most of the graphite grades have a weak texture but distinctly identified. The textural information based on Bacon anisotropy and orientation factors for POCO, Gilsocarbon and PGA graphite grades were obtained from the pole figure data. The MATLAB-based software toolbox MTEX was used for pole figure evaluation and quantification of the Bacon anisotropy and orientation factors to analyse crystallographic preferred orientation in graphite grades. The X-rays' reflective technique is compared and contrasted with the earliest method of diffraction data collection and evaluation from the obtained ring patterns in a transmission mode for anisotropy measurements in graphite materials. The derived anisotropy and orientation factors are then used to correlate with some of the graphite material properties.