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Neutron diffraction studies of a high resolution double crystal (+n,-m) setting containing Si(220) and Si(311) bent perfect crystals in symmetric and fully asymmetric diffraction geometry, respectively

机译:含有Si(220)和Si(311)的高分辨率双晶(+ N,-M)设置的中子衍射研究分别在对称和完全不对称衍射几何形状中弯曲的完美晶体

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In this paper studies of neutron diffraction properties of the double crystal (+n,-m) setting containing Si(220) and Si(311) bent perfect crystals (BPC) in symmetric and fully asymmetric diffraction (FAD) geometry with the output beam expansion (OBE), respectively, are presented. Namely, our attention was focused on the properties of the FAD geometry of the BPC Si(311) crystal slab. It has been found that after a beam expansion this FAD geometry can provide a monochromatic beam of a rather large cross-section and of very small divergence with some possible application use.
机译:在本文研究中,含有Si(220)和Si(311)弯曲的双晶(+ N,-M)设置的中子衍射性能,与输出光束的对称和完全不对称衍射(FAD)几何形状中的弯曲完美晶体(BPC)展示了扩展(奥佩)。即,我们的注意力集中在BPC SI(311)晶体板的FAD几何形状的性质上。已经发现,在光束扩展之后,该FAD几何形状可以提供相当大的横截面的单色光束,并且具有一些可能的应用程序使用的差异非常小。

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