In situ x-ray diffraction, electrical resistivity and thermal measurements using a Paris-Edinburgh cell at HPCAT 16BM-B beamline

摘要

We have established a new type of experimental set-up utilizing a Paris-Edinburgh (PE) type large volume press with a dedicated sample cell assembly for simultaneous x-ray diffraction, electrical resistance, and temperature gradient measurements at the High-Pressure Collaborative Access Team (HPCAT) at Advanced Photon Source (APS), Argonne National Laboratory 16BM-B beamline. We demonstrate the feasibility of performing in situ measurements and correlating the measured electrical-thermal-structural properties over a broad range of P-T conditions by observing the well-known solid-solid and solid-melt transitions of bismuth (Bi) up to 5 GPa and 600° C. The goal of developing this new multi-probe measurement capability is to further improve detection of the onset of solid-solid and solid-melt transitions, relate structural and electrical properties of materials, determine changes in thermal conductivity at high P-T, and ultimately extend the technique for investigating other parameters, such as the Seebeck coefficient of thermoelectric materials.