Mid-Infrared Reflectography for the Analysis of Pictorial Surface Layers in Artworks

摘要

Reflectography in the thermal band Mid-IR 3-5 μm is discussed as a novel tool for the noninvasive analysis of pictorial surface layers in artworks, and its potential is experimentally demonstrated on target models as well as on genuine masterpieces. Reflectography in the Mid-IR is based on the idea of recording the energy reflected by the object, which is strongly related to the surface properties. Therefore, Mid-IR Reflectography has the characteristic feature of providing a good differentiation of surface materials.