In the analysis by spectrometry plasma produced by laser, the composition of the surface layer of a material and for the sample of samples for analysis information or controles of this surface layer, and related

摘要

A system for the analysis by spectrometry of the plasma produced by laser, the composition of the surface layer of a material and for the taking of samples with a view of the analyses, complementary or of this surface layer, and related. The system comprises a single pulsed laser (6), in order to generate a pulsed laser beam, which is able to interact with the surface layer of material and produce a plasma to the surface of the material (4); a device (10, 12) for focusing the laser beam on the surface of the material; a device (18, 20) in order to collect the light emitted by the plasma, and a device (22) for the spectral analysis of the light collected and the determination of the elemental composition of the surface layer from the spectral analysis (nature and concentration of the elements). According to the invention, it also comprises a device (30, 32, 34) in order to suck up and collect particles representative of the surface layer, which is extracted from that - under the effect of the laser beam, in view of the analyses qualitative or quantitative complementary or checks on the basis of said particles.