Test Methods Research and Verify for FPGA

摘要

This paper mainly introduces the principle and usage of dynamic probe technology, and makes comparisons between traditional test method and the most popular debugging method-utilizes the embedded tool of debugging on chip to debug. The research depends on self-designed FPGA test service system based on dynamic probe technology. It also explores how to use existent tools and technology for high efficiency test method in FPGA debug and verify process. Through comparisons, it is possible conclude that dynamic probe technology is able to cope with the complex test requirements, and provide more accurate sampling data than the general method in the debugging process. More importantly, the dynamic probe can complete switching a group of the internal signal to be measured within a few seconds, which greatly reducing the waiting time of debugging.