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Optoelectronic characterization of morphology-controlled zinc oxide nanowires

机译:形态控制氧化锌纳米线的光电子特征

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In this paper, we report the characterization of vertically aligned ZnO nanowire (NW) arrays synthesized by metal-catalyzed chemical vapor deposition. The growth mechanism of ZnO NWs may be related to vapor-solid-nucleation. Morphological, structural, optical and field emission characteristics can be modified by varying the growth time. For growth time reaches 120 min, the length and the diameter of ZnO NWs are 1.5 um and 350 nm, and they also show preferential growth orientation along the c-axis. Moreover, strong alignment and uniform distribution of ZnO NWs can effectively enhance the antireflection to reach the average reflectance of 5.7% in the visible region as well. Field emission measurement indicated that the growth time play an important role in density- and morphology-controlled ZnO NWs, and thus ZnO NWs are expected to be used in versatile optoelectronic devices.
机译:在本文中,我们报告了通过金属催化的化学气相沉积合成的垂直对齐ZnO纳米线(NW)阵列的表征。 ZnO NWS的生长机制可能与蒸汽固氮核相关有关。通过改变生长时间可以改变形态学,结构,光学和场发射特性。对于生长时间达到120分钟,ZnO NWS的长度和直径为1.5μm和350nm,并且它们还显示沿着C轴的优先生长取向。此外,ZnO NWS的强对准和均匀分布可以有效地增强了可见区域中5.7%的平均反射率的抗反射。场排放测量表明,生长时间在密度和形态控制的ZnO NW中发挥着重要作用,因此预期ZnO NWS将用于多功能光电器件。

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