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Dependence of Microstructure Induced with Manufacturing Parameters and Physical Properties of Compound of Skutterudite Structure Type Ce_xFeCo_3Sb_(12)

机译:制造参数诱导的微观结构的依赖性以及Skutterudite结构型化合物的物理性质Ce_xFeco_3SB_(12)

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The skutterudites from Ce_xFeCo_3Sb_(12) series, where x = 0.3, 0.6, 0.9 and 1, were analyzed. The microstructure investigation indicates that increase of alloying duration clearly improves the chemical homogeneity of the compounds. The type of protective medium (acetone or argon), used during alloying, has been found to influence mainly the phase purity of obtained compounds. Precipitations of antimony are smaller in the compounds prepared in liquid environment. The existence of various oxide contaminations depends also on the type of protective medium used. In the compounds alloyed in acetone distribution of oxygen was evidently correlated with iron, whereas in compounds produced in argon cerium is partially oxidized. Temperature dependences of Seebeck coefficient and electrical resistivity were measured in temperature range from 300K to 780K. Beside the influence of the composition of a compound, also the influence of its microstructure on the values of thermoelectric power factor (PF) and temperature of its maximum has been observed. The compounds prepared in argon exhibit several times larger maximum values of PF. Regardless of the protective medium used, the highest values of PF always were obtained for compounds with the lowest Ce content.
机译:分析来自CE_XFECO_3SB_(12)系列的Skutturedites,其中x = 0.3,0.6,0.9和1进行了分析。微观结构研究表明,合金化持续时间的增加明显提高了化合物的化学均匀性。已经发现在合金化期间使用的保护介质(丙酮或氩气)的类型主要影响得到的化合物的相纯度。在液体环境中制备的化合物中锑的沉淀较小。各种氧化物污染的存在也取决于所用的保护介质的类型。在金属化合物中,丙酮的丙酮分布的化合物明显与铁相关,而在氩气中产生的化合物中部分氧化。塞贝克系数和电阻率的温度依赖性在300k至780k的温度范围内测量。除了化合物的组成的影响之外,还观察到其微观结构对热电功率因数(PF)值和其最大温度的影响。在氩中制备的化合物表现出多倍的PF值较大的最大值。无论使用的保护介质如何,始终获得具有最低CE含量的化合物的PF的最高值。

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