Microstructural and dielectric properties of conventional and microwave sintered CaCu_3Ti_4O_(12) ceramics

摘要

It's well known that CaCu_3Ti_4O_(12) (CCTO) ceramic presents high dielectric constants, which makes it a strong candidate to be used in microelectronic devices. Several routes were proposed to obtain CCTO crystalline phase, influencing in microstructure and sintering conditions of the ceramics. In this study CCTO powders were produced by a new chemical route, providing reduction on hold time and sintering temperature. Furthermore, the sintering was performed in conventional and microwave oven that produced different microstructures. In this way, the microstructure and dielectric properties of these ceramics were evaluated and compared, showing the higher values of dielectric constant due to lower grain size and reduced copper-rich phase on grain boundary presented by microwave sintered ceramics.