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Effect of Cu dopant on the electrical property of ZnO thin films deposited by pulsed laser deposition

机译:Cu掺杂剂对脉冲激光沉积沉积的ZnO薄膜电性能的影响

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Cu-doped ZnO (denoted by ZnO:Cu) films have been prepared by pulsed laser deposition using 3 wt. CuO doped ZnO ceramic target. The carrier concentrations (10~(11)~10~(18)cm~(-3))and, electrical resistivity (10~(-1)~10~5 Ωcm) of deposited Cu-doped ZnO thin films were varied depending on deposition conditions. Variations of electrical properties of Cu-doped ZnO indicate that copper dopants may play an important role in determining their electrical properties, compared with undoped films. To investigate effects of copper dopants on the properties of ZnO thin films, X-Ray diffraction (XRD), photoluminescence (PL), and Hall measurements have been performed and corresponded.
机译:通过3重量%的脉冲激光沉积制备了Cu-掺杂的ZnO(由ZnO:Cu)薄膜制备。 Cuo掺杂ZnO陶瓷靶标。载流子浓度(10〜(11)〜10〜(18)cm〜(-3)),并且沉积的Cu掺杂ZnO薄膜的电阻率(10〜(-1)〜10〜5Ωcm)取决于关于沉积条件。与未掺杂的薄膜相比,Cu掺杂ZnO的电性能的变化表明铜掺杂剂在确定其电性能方面可能发挥重要作用。为了研究铜掺杂剂对ZnO薄膜的性质的影响,已经进行了X射线衍射(XRD),光致发光(PL)和霍尔测量。

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