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Preparation of N-type Cuprous Oxide Films via Electrodeposition Method and their Photoelectrochemical Activities

机译:电沉积法制备N型氧化铜膜及其光电化学活性

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The n-type Cu_2O films were deposited on ITO substrate by three-electrode electrochemical deposition method in a CuS04-lactic acid electrolyte. The effects of electrolyte pH, bath temperature, and annealing treatment on films' conductivity and their photoelectrochemical activity were investigated by X-ray diffraction (XRD), photocurrent (I-t) and mott-schottky (M-S) plots. The results show that the n-type Cu_2O could be electrodeposited at electrolyte pH of 8.5, 9 and 10, and the electrolyte temperature did not change the films' conductivity. The highest n-type photocurrent density of 0.014 mA/cm~2 and carrier concentration of 2.3×10~(19) cm~(-3) was obtained when the electrolyte pH was 8.5 and the bath temperature was 60 °C. With increasing annealing temperature from 150°C to 400°C, the photocurrent density and carrier concentration of n-type Cu_2O thin films correspondingly increased, indicating that heat treatment is helpful to improve the photoelectrochemical activity.
机译:在CUS04-乳酸电解质中通过三电极电化学沉积法在ITO基板上沉积N型Cu_2O膜。通过X射线衍射(XRD),光电流(I-T)和Mott-Schottky(M-S)图研究了电解质pH值,浴温和退火处理对膜的电导率和它们的光电化学活性的影响。结果表明,N型Cu_2O可以在8.5,9和10的电解质pH下电沉积,电解质温度没有改变膜的电导率。当电解质pH为8.5时,获得0.014mA / cm〜2和2.3×10〜(19)cm〜(-3)的最高N型光电流密度和2.3×10〜(19)cm〜(-3)的光电流密度。浴温度为60℃。随着150℃至400℃的增加温度,N型Cu_2O薄膜的光电流密度和载体浓度相应地增加,表明热处理有助于改善光电化学活性。

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