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Simulation of microwave power characteristics of AlGaN/AlN/GaN HEMT

机译:AlGaN / ALN / GAN HEMT微波功率特性的仿真

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A systematic AlGaN/AlN/GaN HEMT physical based numerical model is established in this paper. This model includes field-dependent mobility, polarization effect, interface state, surface state, and traps. The model has been implemented into TCAD Silvaco. And the simulated DC and RF characterization fit the measured results well. The effects of source field plate on AlGaN/AlN/GaN HEMT breakdown voltage and DC drain current is also studied based on the established model. The off-state breakdown voltage was significantly improved by employing a source field plate. This is because the source field plate redistributes the electric fields in the gate-to-drain region.
机译:本文建立了系统的AlGaN / ALN / GaN HEMT物理模型。 该模型包括现场依赖的移动性,偏振效果,接口状态,表面状态和陷阱。 该模型已实施为TCAD Silvaco。 和模拟的直流和RF表征适合测量结果。 基于已建立的模型,还研究了源场板对AlGaN / AlN / GaN HEMT击穿电压和直流漏电流的影响。 通过采用源场板显着改善了偏离状态击穿电压。 这是因为源场板重新分配了栅极到漏区中的电场。

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