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Effect of Sc Doping on Ferroelectric and Dielectric Properties of Bi_(0.9)La_(0.1)FeO_3 thin Film by Sol-Gel process

机译:SC通过溶胶 - 凝胶工艺对SC掺杂对Bi_(0.9)La_(0.1)FeO_3薄膜的铁电和介电性能的影响

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Pure Bi_(0.9)La_(0.1)Fe_(1-x)Sc_xO_3 (x = 0, 0.05, 0.10, 0.15, 0.20) (BLFSO) thin films were deposited on conductive indium tin oxide (ITO)/glass substrates through a simple sol-gel process. The effect of Sc doping on the XRD, microstructure, dielectric and ferroelectric properties of BLFO films was studied. Compared to counterparts of Bi_(0.9)La_(0.1)FeO_3 (BLFO) film, the grain refinement of all films is obvious. When the value of Sc is 0.15, the double remanent polarization 2Pr is effectively enhanced with the extreme value of 17.7μC/cm~2. The dielectric constant exhibits a trends of increase firstly and then decrease with the increase amount of scandium level.
机译:纯Bi_(0.9)LA_(0.1)FE_(1-x)SC_XO_3(x = 0,0.05,0.10,0.15,0.20)(BLFSO)薄膜通过简单沉积在导电铟锡(ITO)/玻璃基板上沉积在导电铟锡(ITO)/玻璃基板上。溶胶 - 凝胶过程。研究了SC掺杂对BLFO薄膜XRD,微观结构,电介质和铁电性能的影响。与Bi_(0.9)的对应物相比(0.1)Feo_3(BLFO)薄膜,所有薄膜的晶粒细化是显而易见的。当SC的值为0.15时,双重再现极化2pr有效地增强,极值为17.7μc/ cm〜2。介电常数首先表现出增加的趋势,然后随着钪水平的增加而降低。

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