【24h】

Electrodeposition of Copper in Trenches From a Citrate Plating Bath

机译:从柠檬酸盐镀浴中电沉积在沟槽中的沟槽

获取原文

摘要

In 1997 IBM introduced copper as the electrical contact in their chips. The wires made of copper are about 40% less resistant than traditional aluminum wiring. In addition, copper shows less tendency to electromigration so, compared with aluminum, the use of copper improves the lifetime of the wire and the speed of chip (1). As an added advantage, copper can be electrodeposited at high deposition rates under ambient conditions.
机译:1997年,IBM将铜引入其芯片中的电气接触。铜制铜的电线比传统的铝线耐耐力约40%。此外,铜表现出对电迁移的倾向,因此与铝相比,铜的使用改善了电线的寿命和芯片的速度(1)。作为附加的优点,可以在环境条件下在高沉积速率下电沉积铜。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号