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PACKAGING AND WIDE-PULSE SWITCHING OF 4 MM × 4 MM SILICON CARBIDE GTOs

机译:包装和宽脉冲切换4 mm×4 mm碳化硅gtos

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The U. S. Army Research Laboratory (ARL) is investigating compact, energy-dense electronic components to realize high-power, vehicle-mounted survivability and lethality systems. These applications require switching components that are low in weight and volume, exhibit reliable performance, and are easy to integrate into the vehicles' systems. The devices reported here are 4 mm × 4 mm silicon carbide GTOs rated for 3000 V blocking. These devices were packaged at ARL for high pulse current capability, high voltage protection, and minimum package inductance. The GTOs were switched in a 1-ms half-sine, single-pulse discharge circuit to determine reliable peak current and recovery time (or T_q). The GTOs were repeatedly switched over 300 A peak (3.3 A/cm2 and an action of 60 A~2s) with a recovery time of 20 μs. The switches were also evaluated for dV/dt immunity up to an instantaneous slope of 3 kV/ μs.
机译:美国军队研究实验室(ARL)正在调查紧凑,能量密集的电子元件,实现高功率,车载的生存能力和致死态系统。这些应用需要切换组件,其重量和体积低,表现出可靠的性能,并且易于集成到车辆系统中。此处报告的设备为4 mm×4毫米碳化硅GTO,额定为3000 V阻挡。这些器件在ARL封装,用于高脉冲电流能力,高压保护和最小封装电感。将GTO切换在1ms半正弦,单脉冲放电电路中以确定可靠的峰值电流和恢复时间(或T_Q)。通过20μs的恢复时间重复地将GTO在300°(3.3a / cm 2和60a〜2s的动作)上切换超过300峰值。还评估开关的DV / DT免疫直至3kV /μs的瞬时斜率。

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