【24h】

COMPACT DYNAMIC INTERFEROMETER FOR ON-MACHINE MEASUREMENT

机译:紧凑动态干涉仪,用于机上测量

获取原文

摘要

We present a compact, vibration insensitive interferometer design that is well suited for measuring optics while mounted in-situ on polishing equipment. The system employs a single frame phase sensor that permits acquisition in tens of microseconds to mitigate the effects of vibration or relative motion with the test part. The theory of operation is presented along with experimental test results, which characterize repeatability and precision under static and high-vibration conditions. The vibration frequency response of the interferometer is assessed. In addition, Theoretical and measured instrument spatial resolution (instrument transfer function) and retrace error are compared. We also present preliminary measurements made with a prototype system mounted in a commercial polishing machine.
机译:我们提供了一种紧凑的振动不敏感的干涉仪设计,非常适合测量光学器件,同时在抛光设备上安装原位。该系统采用单个帧相位传感器,其允许以几十微秒的采集以减轻振动或相对运动与测试部件的影响。操作理论与实验测试结果一起提出,其在静态和高振动条件下表征了可重复性和精度。评估干涉仪的振动频率响应。此外,比较了理论和测量仪器空间分辨率(仪器传递函数)和回溯误差。我们还通过安装在商业抛光机中的原型系统提出初步测量。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号