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A polarized lateral shearing interferometer and application for on-machine form error measurement of engineering surfaces.

机译:一种偏振横向剪切干涉仪及其在工程表面的机上误差测量中的应用。

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摘要

As technology in the semiconductor and optics industries advances very rapidly, demands for high quality surfaces such as optical mold surface and wafer surface are steadily increasing. This has posed greater challenges than ever before to precision machining in making precision objects.; To meet the challenge, direct on-machine surface measurement has become very important. However, there exist little practical application examples for on-machine precision surface measurement, in particular for form error measurement, due to the difficulties in handling vibrations and disturbances, commonly experienced during a machining process, without compromising measurement precision.; To deal with the problems, a novel optical interferometer is proposed based on a shearing interference principle. The proposed interferometer is simple and compact in structure, features a complete common optical path with polarized phase shifting interference, and is less sensitive to vibrations and environmental disturbances to have good stability and reliability, while high precision is maintained by the optical approach.; For accurate, stable, and convenient interferogram analysis in the new interferometer, a new phase unwrapping algorithm is developed based on wrapped phase statistics and phase correction. For reliable, accurate, and convenient wave front reconstruction from shearing interferometric phases, the existing Zernike polynomial fitting algorithm is improved. A new point-to-point mapping based least square algorithm and a B-Spline based fitting algorithm have been proposed.; A prototype of the new interferometer has been developed. The accuracy and characteristics of the proposed device for on-machine measurement are analyzed. Experimental tests have been conducted to validate the proposed design and the optical data processing algorithms. The results indicated that the developed prototype device has an error less than 1/80λ under general experimental condition, where λ = 0.6328 μm. Under the on-machine condition of 0.4 μm and 12.22 μrad vibrations commonly found in precision machining, the error was less than 1/60λ. The results show that the proposed interferometer is quite suitable for on-machine form error measurement for machining many precision objects.
机译:随着半导体和光学行业中技术的飞速发展,对高质量表面(如光学模具表面和晶片表面)的需求稳步增长。这给制造精密物体的精密加工带来了前所未有的挑战。为了应对这一挑战,直接进行机上表面测量变得非常重要。然而,由于在机械加工过程中通常遇到的在不影响测量精度的情况下处理振动和干扰的困难,因此在机械上精确的表面测量,特别是形状误差测量方面,几乎没有实际的应用实例。针对这些问题,提出了一种基于剪切干涉原理的新型光学干涉仪。所提出的干涉仪结构简单紧凑,具有完整的光路,具有偏振相移干涉,对振动和环境干扰较不敏感,具有良好的稳定性和可靠性,同时通过光学方法保持了高精度。为了在新的干涉仪中准确,稳定和方便地进行干涉图分析,基于包裹相位统计和相位校正,开发了一种新的相位展开算法。为了从剪切干涉相中可靠,准确,方便地重建波前,对现有的Zernike多项式拟合算法进行了改进。提出了一种新的基于点对点映射的最小二乘算法和一种基于B样条的拟合算法。新的干涉仪的原型已经开发出来。分析了所提出的机上测量设备的准确性和特性。已经进行了实验测试以验证所提出的设计和光学数据处理算法。结果表明,在一般实验条件下,λ= 0.6328μm,开发的原型设备的误差小于1 /80λ。在精密加工中常见的0.4μm的机上条件和12.22μrad的振动条件下,误差小于1 /60λ。结果表明,所提出的干涉仪非常适用于加工许多精密物体的在机形式误差测量。

著录项

  • 作者

    Liu, Xiaojun.;

  • 作者单位

    Hong Kong University of Science and Technology (People's Republic of China).;

  • 授予单位 Hong Kong University of Science and Technology (People's Republic of China).;
  • 学科 Engineering Mechanical.
  • 学位 Ph.D.
  • 年度 2003
  • 页码 162 p.
  • 总页数 162
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 机械、仪表工业;
  • 关键词

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