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Implementing E-beam Correction Strategies for Compensation of EUVL Mask Non-flatness - (PPT)

机译:实现EUVL面罩非平整度补偿的电子束校正策略 - (PPT)

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Non-flatness compensation is a key enabler for EUV lithography. SEMATECH and partners demonstrated for the first time that non-flatness correction work. Flatness compensation should have a major impact on mask cost enables relaxed flatness standards - easier to meet defect requirements (flatness/defectivity trade-off).
机译:非平整度补偿是EUV光刻的关键推动器。 SEMATECH和合作伙伴首次展示了非平坦的校正工作。平整度补偿应对面罩的重大影响是掩模成本,使放松的平坦度标准 - 更容易满足缺陷要求(平整度/缺陷折衷)。

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