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Evaluation of quasi-ballistic transport in nano-MOSFETs by deterministic solver of the time dependent multi-subbands Boltzmann Transport Equation

机译:纳米MOSFET在时间依赖性多亚带Boltzmann传输方程中的纳米MOSFET中的准弹性传输评估

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In this paper, the ballistic and quasi-ballistic transport characteristics of Sub-30 nm double gate MOSFETs are simulated by deterministic solver of the Time Dependent Muti-subbands Boltzmann Transport Equation [1]. The scattering effect on the Sub-30 nm double gate MOSFETs is investigated not only through analyzing ON current, but also the source to channel barrier height, average electron velocity and electron density at virtual source (VS: top of the barrier).
机译:在本文中,通过时间依赖性uti子带Boltzmann传输方程的确定性求解器模拟了Sub-30 nm双栅极MOSFET的弹道和准弹道传输特性[1]。不仅通过在电流上分析来研究对Sub-30 NM双栅极MOSFET的散射效果,还通过分析到频道阻挡高度,虚拟源(VS:屏障顶部)的通道屏障高度,平均电子速度和电子密度。

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