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Sensitivity Analysis of Technological Fabrication Tolerances on the Lifetime of Flip-Chip Solder Joints

机译:倒装芯片焊点寿命的技术制造公差的敏感性分析

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In this paper we discuss the influence of solder joint geometry on the lifetime of a flip chip assembly. Geometry variations caused by variations of solder volume, pad configuration, and pad size on the Printed Circuit Board (PCB) were taken into account. Typically these parameters vary due to technological fabrication tolerances. Consequently, the influence of such design aspects on system reliability was studied in detail by using Finite Element Analysis (FEA) models. Selected solder joint geometry variations were assembled and tested in a thermal cycling chamber. Simulation and experimental results were compared and some advice is given regarding their evaluation.
机译:本文探讨了焊接关节几何形状对倒装芯片组件的寿命的影响。考虑了由印刷电路板(PCB)上的焊料体积,垫配置和焊盘尺寸引起的几何变化。通常,这些参数由于技术制造公差而变化。因此,通过使用有限元分析(FEA)模型详细研究了这种设计方面对系统可靠性的影响。在热循环室中组装并测试了所选焊接关节几何变化。比较模拟和实验结果,有关他们的评估,请咨询一些建议。

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