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Cyclically Varying Hydrogen Dilution for the Growth of Very Thin and Doped Nanocrystalline Silicon Films by Hot-Wire CVD

机译:通过热线CVD循环改变氢气稀释,用于通过热线CVD生长非常薄和掺杂的纳米晶硅膜

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Hot-Wire Chemical Vapour Deposition (HW-CVD) technique has demonstrated to be a good alternative to deposit quality thin films at low temperature. In this paper we focus our study on very thin (50 nm) n- and p-doped nc-Si:H films deposited at low substrate temperature around 100°C. We have observed that, in this low temperature deposition conditions, the promotion of an a-Si:H incubation layer leads to a poor doping efficiency and poor electrical properties of the films. Hence, in addition to the optimization of the deposition conditions, we deposited doped layers by cyclically varying the hydrogen dilution (CVH) during deposition process. This CVH method promotes a layer-by-layer growth and inhibits the formation of the incubation layer. Several doped nc-Si:H layers have been deposited with and without this CVH method. The structural, electrical and optical properties of these films and advantage of CVH in improving the device quality of the thin doped layers are reported.
机译:热线化学气相沉积(HW-CVD)技术已经证明是在低温下沉积质量薄膜的良好替代方案。在本文中,我们将我们的研究专注于非常薄的(50nm)和p掺杂的NC-Si:H薄膜,在低底物温度约为100℃下沉积。我们观察到,在该低温沉积条件下,促进A-Si:H孵育层导致掺杂效率不佳,薄膜的电气性质差。因此,除了沉积条件的优化之外,我们通过在沉积过程中循环改变氢稀释度(CVH)来沉积掺杂层。该CVH方法促进了逐层生长并抑制孵育层的形成。已经沉积了几种掺杂的NC-Si:H层,没有这种CVH方法。报道了这些薄膜的结构,电气和光学性质以及CVH在提高薄掺杂层的器件质量方面的优点。

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