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Chemical Mechanical Polishing of Transparent Nd:YAG Ceramics

机译:透明ND的化学机械抛光:YAG陶瓷

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Transparent Nd:YAG ceramics which are very hard and brittle materials, are very difficult to be polished. There are many micro scratches or damages on the surface after mechanical polishing with Al_2O_3. In order to remove micro scratches or damages, chemical mechanical polishing (CMP) was adopted to manufacture Nd:YAG ceramics. In the polishing experiment, Pellon and Chemcloth pads were utilized for chemical mechanical polishing of Nd:YAG ceramics. Colloidal SiO_2 was selected as the polishing slurry in two different polishing environments, acidity and alkalinity. The surface roughness was determined by using atomic force microscope. In this study, four polishing experimental combinations that each combination contains one of the two pads and one of the two polishing environments were carried out in the optimum polishing condition. Then the high quality surface of transparent Nd: YAG ceramics with the best surface roughness of < 0.2 nm RMS and few micro scratches or damages is obtained by adopting CMP process with Chemcloth pad and colloidal SiO_2 in acidic condition.
机译:透明ND:非常坚硬且脆性材料的YAG陶瓷非常难以抛光。在用Al_2O_3机械抛光后,表面上有许多微划痕或损坏。为了去除微划痕或损坏,采用化学机械抛光(CMP)制造ND:YAG陶瓷。在抛光实验中,利用沉积物和切化垫进行ND:YAG陶瓷的化学机械抛光。选择胶体SiO_2作为两种不同的抛光环境,酸度和碱度的抛光浆料。通过使用原子力显微镜测定表面粗糙度。在本研究中,四种抛光实验组合,每个组合包含两个焊盘中的一个和两个抛光环境中的一个,以最佳的抛光条件进行。然后通过采用ChecCloth Pad和酸性条件下的胶体SiO_2,通过采用CMP工艺获得最佳表面粗糙度<0.2nm rms的最佳表面粗糙度<0.2nm rms和几个微划痕或损坏的优质表面。

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