Measurement Range Induced Electron Density Perturbations in X-Ray Reflectometry

摘要

Refining XRR electron density profiles using unconstrained methods, such as GTM may be subject to the introduction of oscillatory artifacts derived from the limited sampling Q-space present in a measurement. Note that in our example, the cause of introduction was stopping data collection prematurely (at < 10°2θ). However, having an inadequate signal to noise ratio caused by either bad sample alignment, instrument alignment, or weak X-ray tube, too aggressive of a monochromator, or lack of a parabolic optic could lead to such oscillations being present even with large data collection ranges.