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Characterization of contour shapes achievable with a MEMS deformable mirror

机译:使用MEMS可变形镜可实现轮廓形状的表征

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An important consideration in the design of an adaptive optics controller is the range of physical shapes required by the DM to compensate the existing aberrations. Conversely, if the range of surface shapes achievable with a DM is known, its suitability for a particular AO application can be determined. In this paper, we characterize one MEMS DM that was recently developed for vision science applications. The device has 140 actuators supporting a continuous face sheet deformable mirror having 4mm square aperture. The total range of actuation is about 4μm, achieved using electrostatic actuation in an architecture that has been described previously. We incorporated the MEMS mirror into an adaptive optics (AO) testbed to measure its capacity to transform an initially planar wavefront into a wavefront having one of thirty-six orthogonal shapes corresponding to the first seven orders of Zernike polynomials. The testbed included a superluminescent diode source emitting light with a wavelength 630nm, a MEMS DM, and a Shack Hartmann wavefront sensor (SHWS). The DM was positioned in a plane conjugate to the SHWS lenslets, using a pair of relay lenses. Wavefront slope measurements provided by the SHWS were used in an integral controller to regulate DM shape. The control software used the difference between the the wavefront measured by the SHWS and the desired (reference) wavefront as feedback for the DM. The DM is able to produce all 36 terms with a wavefront height root mean square (RMS) from 1.35μm for the lower order Zernike shapes to 0.2μm for the 7th order.
机译:自适应光学控制器的设计中的一个重要考虑因素是DM补偿现有像差所需的物理形状范围。相反,如果已知具有DM的表面形状的范围,则可以确定其对特定AO应用的适用性。在本文中,我们描述了最近为视觉科学应用开发的一个MEMS DM。该装置具有140个致动器,支撑具有4mm平方孔的连续面板可变形镜。致动的总范围约为4μm,在先前描述的架构中使用静电致动实现。我们将MEMS镜掺入一个自适应光学(AO)测试平台,以测量其最初平面波前将最初平面波前的能力转换为具有与Zernike多项式的前七个阶数对应的三十六个正交形状中的一个波前。该测试平板包括发光的高级发光二极管源发射波长630nm,MEMS DM和Shack Hartmann波前传感器(Shws)。使用一对中继透镜,DM定位在与SHWS LESELLET的平面中。由SHW提供的波前斜率测量用于整体控制器以调节DM形状。控制软件使用SHW和所需(参考)波前测量的波前与DM的反馈所测量的波前之间的差异。 DM能够以1.35μm的波前高度根均线(RMS)产生所有36个术语,对于第7阶,下级Zernike形状为0.2μm。

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