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A Proposed Mechanism and Remedy for Ball-in-Socket and Foot-in-Mud Soldering Defects on Ball Grid Array and Quad Flat Pack Components

机译:球栅阵列和四边形平包组件上的圆形插槽和静泥浆焊接缺陷的建议机制和补救措施

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A common source of defects on area array components is the "ball-in-socket" (or "pillowhead") defect. This defect is defined as one or more connections that show physical contact but no wetting or intermetallic connection after reflow. The defect is difficult to detect on x-ray, and can only really be verified on cross section or if the joint in question is in a location accessible to visual inspection. Worse, the assembly may pass electrical test, since there may physical contact between the bulk solder and the metallization on the component lead. The lack of an intermetallic bond results in almost immediate failure in the field, however. The same sort of defect can also occur on large quad flat pack components, with the component lead resting on top of the solder deposit without a metallurgical connection. In this case, the defect is referred to as a "foot-in-mud" defect. The source of these defects is not always obvious, and little has been written about their prevention. This paper presents an in-depth examination of the physical causes of this defect type, along with specific steps that may be taken to eliminate it. There are several potential root causes, but the end result of all is vertical movement of one portion of the component (tilting), resulting in lack of contact with the land during soldering. Formation of an intervening oxide layer prevents soldering, even when the two metal surfaces are brought together. Prevention of these defects relies on good design practices that limit thermal gradients, well-designed reflow profiles and capable reflow equipment. The specific solder paste used can also have an impact on the appearance of this defect, for several reasons including the alloy melting behavior, flux activity and rheology, and printing characteristics.
机译:区域阵列组件上的常见缺陷源是“球形插座”(或“枕头”)缺陷。该缺陷定义为一个或多个连接物理触点但在回流后没有润湿或金属间连接。缺陷难以检测X射线,并且只能在横截面上真正验证,或者如果有问题的联合处于可用于目视检查的位置。更糟糕的是,组装可以通过电气测试,因为散装焊料与组分铅上的金属化之间可能存在物理接触。然而,缺乏金属间粘合导致该领域几乎立即发生故障。在大型四扁平包装组件上也可以发生同样的缺陷,其中部件引线在焊料沉积物顶部而无需冶金连接。在这种情况下,缺陷被称为“静静静静电”缺陷。这些缺陷的来源并不总是显而易见的,很少有关于他们预防的。本文提出了对该缺陷类型的物理原因的深入检查,以及可能采取的具体步骤消除它。存在几个潜在的根本原因,但是所有的最终结果是组分(倾斜)的一部分的垂直运动,导致焊接期间与土地缺乏接触。介入氧化物层的形成防止焊接,即使在两个金属表面均在一起时。预防这些缺陷依赖于限制热梯度,精心设计的回流型材和能力的回流设备的良好设计实践。由于包括合金熔化行为,助熔剂和流变学和印刷特性,所用的特定焊膏也会对这种缺陷的外观产生影响。

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