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A transmission electron energy loss spectrometry study for the source of an anomalous positive exchange bias in a Ni{sub}80Fe{sub}20/Ni{sub}xFe{sub}(1-x)O thin-film bilayer

机译:透射电子能量损失光谱测定光谱研究Ni {Sub} 80Fe {Sub} 20 / Ni} XFE {Sub}(1-x)薄膜双层

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Exchange coupling between a ferromagnetic and antiferromagnetic bilayer that results in an exchange bias shift of the hysteresis loop in the positive field direction (i.e. positive exchange bias) was first reported in the pure ferromagnet/antiferromagnet thin-film systems of Fe/FeF{sub}2 and Fe/MnF{sub}2 [1]. In these materials a large cooling field was required to reverse the easy direction of the exchange coupling and provided the mechanism for positive exchange bias [2]. Using transmission electron energy loss spectrometry we explore the possible origins for an atypical temperature dependent positive exchange bias in a Ni{sub}80Fe{sub}20/Ni{sub}xFe{sub}(1-x)O thin-film when it is zero-field cooled that shows the usual negative exchange bias when it is field cooled.
机译:在Fe / Fef {Sub}的纯铁源/反铁罩薄膜系统中首先报道导致滞后环的铁磁和反铁磁双层之间的交换耦合。在FE / FEF {SUB}的纯铁源/反晶片薄膜系统中首先报道滞后环(即阳性交换偏压)的交换偏移2和fe / mnf {sub} 2 [1]。在这些材料中,需要大的冷却场来反转交换耦合的简便方向,并提供了正交偏置的机构[2]。使用透射电子能量损失光谱法,我们探讨了NI {Sub} 80Fe {Sub} 20 / Ni {Sub} XFE {Sub} XFE {Sub}(1-x)O薄膜中的非典型温度依赖性正交偏差的可能起源零场冷却是在冷却的场地时显示通常的负面交换偏差。

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