Negative ion atmospheric pressure ionization and selected ion mass spectrometry using a 63NI electron source

摘要

Negative ion atmospheric pressure ionization mass spectrometers and selected ion mass spectrometers with a ⁶³Ni ion source and a drift tube for reaction of a sample with electrons from the ⁶³Ni ion source prior to analysis of a sample by mass spectrometry are provided. Also provided are methods for chemically analyzing a sample by negative ion atmospheric pressure ionization mass spectrometry by exposing the sample to electrons from a ⁶³Ni ion source in a drift tube and allowing the sample and electrons to react in the drift tube prior to analysis via mass spectrometry.