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p~+-InAsSbP/n-InAs PHOTODIODES FOR IR OPTOELECTRONIC SENSORS

机译:用于IR光电传感器的P〜+ -INASSBP / N-INAS光电二极管

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The performance of p~+-InAsSbP/n-InAs infrared (IR) photodiodes prepared by liquid phase epitaxy technique (LPE) is investigated. The current-voltage and capacitance-voltage characteristics, photoresponse and noise spectra are investigated in the temperature range 77-300 K. The trap-assisted current is calculated and compared with experimental data. It is found that at near-room temperatures and small reverse biases U ≤ 0.2 V experimental I-U characteristics are determined by diffusion and generation-recombination mechanisms. The trap-assisted tunnelling is shown to be dominant at higher reverse biases. The heterojunction photodiodes have superior photoresponse spectra in comparison with homojunction photodiodes and high threshold parameters.
机译:研究了通过液相外延技术(LPE)制备的p〜+ -Inassbp / n-InAs红外(IR)光电二极管的性能。在77-300k的温度范围内研究了电流电压和电容 - 电压特性,光响应和噪声光谱。计算陷阱辅助电流并与实验数据进行比较。发现在接近室温和小反向偏置u≤0.2V实验I-U特征时由扩散和产生 - 重组机构确定。陷阱辅助隧道显示在更高的逆偏压下占主导地位。与同性带光电二极管和高阈值参数相比,异质结光电二极管具有优异的光孔光谱。

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