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Characterization of Acid Copper Plating Solution for Via-Filling

机译:通过填充酸铜电镀液的表征

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The use of acid copper plating process for via-filling effectively forms interlayer connection in build-up PWBs with high-density interconnections. However, in the case of copper film deposited in a bath, which is greatly dependent on the effects of additives like via-filling technique, the drop in mechanical properties and the increase in stress in electro-deposits due to co-deposition of the additives are likely weaknesses. In view of such weaknesses, we concentrated our study on the mechanical properties of the copper films plated in two types of conformal acid copper plating baths that have been in use for some time and two types of acid copper plating baths for via-filling. As a result, selection of suitable additives was confirmed to be of great importance for the acid copper plating bath for via-filling. The use of the additives that easily deposit with copper was likely to cause drop in mechanical properties of the film. On the other hand, the fact that the acid copper plating process for via-filling nevertheless deposits a film comparable to that out of the recognized conformal type acid copper plating bath in the use of the most suitable additives was confirmed.
机译:使用高密度互连的耐酸铜电镀工艺用酸性铜电镀方法有效地形成层压PWB中的层间连接。然而,在沉积在浴中的铜膜的情况下,这极大地依赖于添加剂如填充技术的作用,由于添加剂的共沉积,机械性能下降和电沉积物中的应力增加很可能是弱点。鉴于这种弱点,我们将我们的研究集中在镀铜薄膜的机械性能,这两种共形酸铜镀浴,这是一段时间和两种类型的酸铜镀浴,用于通过填充。结果,确认了选择合适的添加剂,对酸铜镀浴进行了高度重视通过填充的。使用易用铜沉积的添加剂可能导致薄膜的机械性能下降。另一方面,耐酸铜电镀方法仍然沉积在使用最合适的添加剂中的公认的共形酸铜镀铜浴中的薄膜。

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