finite element analysis; acoustic microscopy; soldering; flip-chip devices; delamination; life testing; fatigue cracks; tin alloys; lead alloys; elasticity; viscoelasticity; reliability; solder joint lifetime; flip chip assembly delamination; solder underfill; type B flip chip package; type D flip chip package; thermomechanical behavior; thermal fatigue lifetime; solder joint reliability; C-mode scanning acoustic microscope; C-SAM inspection; package deformation mode; delamination crack length; plastic strain range; shear direction displacement; maximum plastic strain range; underfill material models; constant elasticity; temperature dependent elasticity; viscoelasticity; fractured solder joint; Paris half-empirical equation; fine solder joint; delamination propagation rates; strain energy release rates; Coffin-Manson equation; bumping size; stand-off height; thermal cycling; finite element simulation; SnPb;
机译:底部填充和底部填充分层对倒装芯片焊点中的热应力的影响
机译:带有焊料凸点和各向同性导电粘合剂的倒装板上电路的热循环寿命
机译:带有焊料凸点和各向同性导电粘合剂的倒装板上电路的热循环寿命
机译:倒装芯片组件的焊点寿命和分层
机译:倒装芯片组件焊点中空洞形成的实验研究。
机译:随机空隙的产生以及热冲击载荷对发光二极管倒装芯片焊点机械可靠性的影响
机译:塑料球栅格阵列的焊接接头可靠性,带焊料撞击芯片