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Measuring starch damage on corn flour using the Chopin SDmatic

机译:测量玉米粉的淀粉损伤使用肖邦SDMATIC

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The objective of this study is to determine if it is possible to determine starch damage on corn flour using the Sdmatic. The tests were done on different flours used in a specific application, but the method could be applied to all users of corn flour. For instance, damaged starch on masa flour has an influence on the tortilla foldability. The SDmatic has been developed to measure starch damage in wheat flour using the amperometric method described by Medcalf and Giles (1966). The determination onlytakes less than 10 minutes. We first determined the repeatability of the test on corn flour. The difference between two tests is significantly different when the AI values (Iodine Absorption) differs more than 1.49%. We tested 12 corn flour samples thatwere judged by our supplier as of "good" to "bad" quality. The results obtained with the SDmatic on these 12 samples show that: 1) It is possible to make measurements on corn flour with the SDmatic. 2) The information obtained from the tests results relates well to the corn flour supplier's observations. For the studied specific application, the "good" quality corn flour was linked to a low starch damage. Our supplier's specific application concerns feed industry, details are confidential.
机译:本研究的目的是确定是否可以使用SDMATIC确定玉米粉上的淀粉损伤。测试是在特定应用中使用的不同面粉上进行的,但该方法可以应用于玉米粉的所有用户。例如,Masa面粉上受损的淀粉对玉米饼可折叠性有影响。已经开发了SDMATIC以使用Medcalf和Giles(1966)描述的安培法测量小麦粉的淀粉损伤。该决定别少于10分钟。我们首先确定了玉米粉测试的可重复性。当AI值(碘吸收)的不同程度不同,两个测试之间的差异显着不同。我们测试了12个玉米面粉样本,我们的供应商判断为“良好”至“糟糕”质量。用SDMATIC在这12个样品中获得的结果表明:1)可以用SDMATIC进行玉米粉进行测量。 2)从测试结果获得的信息与玉米面粉供应商的观察结果有关。对于学习的特定应用,“良好”的质量玉米粉与低淀粉损伤有关。我们的供应商的特定应用程序涉及饲料行业,细节是保密的。

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