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STUDY OF LONG TIME-SCALE PHOTOLUMINESCENCE DYNAMICS OF GAN/INGAN QUANTUM WELLS AND COMPARISON WITH SAMPLES GROWN ON ELOG-GAN

机译:GaN / IngaN量子孔的长时间光致发光动力学研究及与elog-GaN种植的样品比较

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Many researches on In_xGa_((1-x))N systems are focused on their optical characteristics, and in particular on their behaviour in very small time scale range. Conversely, in this report we studied optical phenomena that have long-range time constants. In particular, we studied samples where a thin InGaN/GaN interface defines a single quantum well (SQW) structure in the crystal. Tiny fluctuation of the Indium concentration in the SQW induces localized regions of high Photoluminescence (PL) emission. We established conditions by which temporal instabilities in the PL optical signal were detected and characterized. In this study we will present details on these measurements, in particular we will show how locally indium-rich centers seem to be directly involved in the blinking phenomena. We will report too on the dependence of the temporal behaviour with large-scale (bulk) Indium concentration, and we will show how an epitaxially laterally overgrown GaN (ELOG) substrate influence the PL temporal instabilities.
机译:对IN_XGA _((1-x))N系统的许多研究集中在其光学特性上,特别是在非常小的时间尺度范围内的行为。相反,在本报告中,我们研究了具有远程时间常数的光学现象。特别地,我们研究了薄的Ingan / GaN接口在晶体中定义单量子阱(SQW)结构的样品。 SQW中铟浓度的微小波动诱导高光致发光(PL)发射的局部区域。我们建立了PL光信号中的时间不稳定性被检测和表征的条件。在这项研究中,我们将提出有关这些测量的详细信息,特别是我们将展示众多富有铟的中心似乎是如何直接参与眨眼的现象。我们将在大规模(散装)铟浓度上报告时间行为的依赖性,我们将展示外延横向长期的GaN(EloG)衬底如何影响PL暂时稳定性。

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