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STRAIN-INDUCED SELF ASSEMBLING OF NANOVOIDS IN Si/SiGe MULTI-LAYER STRUCTURES

机译:Si / SiGe多层结构中纳米液的应变诱导的自组装

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We report on self-assembled formation of spherically shaped voids in MBE grown SiGe alloy layers implanted in-situ at elevated temperature with low-energy Ge ions, followed by thermal annealing. The voids are of nanometer size and are e xclusively assembled in thin SiGe quantum wells. The voids only appear in the layers after heat treatment at a temperature higher than 700°C, and they are stable up to 950°C. The results are discussed in terms of the separation of the vacancies and interstitials induced by the strain situation around the SiGe quantum wells.
机译:我们报告了在升高温度下植入原位的MBE种植SiGe合金层中的球形空隙的自组装形成,用低能量Ge离子,然后进行热退火。空隙的纳米尺寸是纳米尺寸的,并且在薄的SiGe量子孔中是Xclusive组装。在高于700℃的温度下热处理后,空隙仅出现在层中,它们稳定高达950℃。结果在SiGe量子孔周围的应变情况诱导的空位和间质诱导的空位和间质的分离方面进行了讨论。

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