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Rework of Lead-Free Surface Mount Components

机译:无铅表面安装部件的返工

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Implementation of lead-free solder into an electronics assembly process necessitates the reassessment of the individual factors involved in component attachment and rework. During rework, a component is subjected to multiple thermal cycles to remove and replace the component as well as in preparation of the rework site. With the use of lead-free components, the assemblies are subjected to multiple thermal cycles at higher temperatures than those required for eutectic tin-lead. This increase in temperature imposes additional constraints on the printed circuit board and component materials. The rework of area array devices is complicated by the fact that the solder interconnects are hidden underneath the body of the component. The assembled solder joint (of fine pitch CSPs) has a very small standoff height, adding additional process concerns for rework operations. Other concerns pertinent to rework are the temperature of the neighboring components during rework and the temperature of the component being replaced. Thermal shock to the component being replaced and the neighboring components should be avoided. In addition, the temperature of the neighboring components should be main ained below reflow temperature during rework. These issues, coupled with the limitations of rework equipment to handle lead-free reflow temperatures, make the task of reworking lead-free assemblies more challenging. Reworl processes that are developed for these assemblies are required to be robust. This implies that no damage is done to the PCB and component, and a repeatable process is developed, while preserving the reliability of the assembly and ensuring high throughput. This research, presented in this paper, is focused on rework processes for a variety of fine pitch Chip Scale Packages (CSPs) and passive surface mount devices. Tin-lead, tin-silver, and tin-silver-copper assemblies were included in this study. Comparisons between tin-lead and lead-free processes are presented. Reliability assessment of the reworked assemblies was performed utilizing air-to-air thermal cycling.
机译:将无铅焊料实施到电子组装过程中需要重新评估组件附件和返工所涉及的个体因素。在返工过程中,将组件进行多个热循环,以取出并更换组件以及准备返工部位的准备。通过使用无铅成分,组件在较高温度下对比共晶锡引线所需的较高温度进行多个热循环。这种温度的增加对印刷电路板和部件材料施加了额外的约束。区域阵列设备的返工是复杂的焊料互连隐藏在部件的主体下方的事实中的复杂性。组装焊接接头(精细间距CSP)具有非常小的横向高度,为返工操作增加了额外的工艺顾虑。与返工相关的其他担忧是返工期间相邻部件的温度和被替换的部件的温度。应避免更换部件的热冲击,并且应避免相邻部件。此外,相邻部件的温度应在返工期间的回流温度以下是主要的。这些问题,加上返工设备处理无铅回流温度的局限性,使得重新加工无铅大会的任务更具挑战性。为这些组件开发的REWORL进程需要坚固。这意味着没有对PCB和组件进行损坏,并且开发了可重复的过程,同时保留组装的可靠性并确保高吞吐量。本文介绍的本研究专注于返工过程,用于各种细距芯片刻度封装(CSP)和无源表面安装装置。本研究包括锡铅,锡银和锡银铜组件。介绍了锡铅和无铅工艺之间的比较。利用空气至空气热循环进行重新加工组件的可靠性评估。

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