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Epitaxial growth of Co-doped rutile TiO2 films on TiN buffered silicon

机译:锡缓冲硅上的共掺杂金红石TiO2薄膜的外延生长

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Cobalt-doped TiO2 has been actively investigated for the spintronic applications owing to its high Curie temperature and the presence of n-type electrical behavior. Up to date, oxide-based substrates have been employed for the epitaxial growth of Co-doped TiO2 films. For example, SrTiO3 and LaAlO3 have been used for anatase and Al2O3 for rutile phase stabilization. However, heteroepitaxial growth of a ferromagnetic semiconductor on silicon substrate is of great interest due to potential applications on a basis of advanced silicon microelectronics technology. We report the integration of an epitaxial Co-doped rutile TiO2 film into silicon which has been achieved using a TiN buffer layer. TiN is known to be thermodynamically stable in contact with silicon and provides an excellent template for the overgrowing Co-doped TiO2 through in situ oxidation.
机译:由于其高居里温度和N型电动行为的存在,已经积极研究了钴掺杂的TiO 2。迄今为止,已采用基于氧化物基底物用于共掺杂TiO 2膜的外延生长。例如,SRTIO3和LAALO3已用于锐钛矿和Al2O3,用于金红色相稳定化。然而,由于在先进的硅微电子技术的基础上,硅衬底上的铁磁半导体的异质轴生长对很大的兴趣。我们将外延共掺杂金红石TiO2膜的整合到使用锡缓冲层已经实现的硅。已知锡与硅接触热力学稳定,并为大致掺杂的TiO 2通过原位氧化提供优异的模板。

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