首页> 外国专利> Fabricating compound semiconductor epitaxial wafer comprises depositing silicon thin film on metal substrate, depositing compound semiconductor thin film on silicon buffer layer, and crystallizing compound semiconductor thin film

Fabricating compound semiconductor epitaxial wafer comprises depositing silicon thin film on metal substrate, depositing compound semiconductor thin film on silicon buffer layer, and crystallizing compound semiconductor thin film

机译:制造化合物半导体外延晶片的步骤包括:在金属基板上沉积硅薄膜;在硅缓冲层上沉积化合物半导体薄膜;以及使化合物半导体薄膜结晶化

摘要

Fabricating compound semiconductor epitaxial wafer comprises: depositing silicon thin film on metal substrate; depositing compound semiconductor thin film on silicon buffer layer; crystallizing compound semiconductor thin film; applying first thermal treatment process; and applying second thermal treatment process. Fabricating compound semiconductor epitaxial wafer comprises: depositing a silicon thin film on a metal substrate to form a first silicon buffer layer; depositing a compound semiconductor thin film on the first silicon buffer layer to form a second compound semiconductor buffer layer; depositing a compound semiconductor thin film on the second compound semiconductor buffer layer to form a third compound semiconductor buffer layer; crystallizing a compound semiconductor thin film on the third compound semiconductor buffer layer to form a first compound semiconductor epitaxial layer; applying a first thermal treatment process; crystallizing a compound semiconductor thin film on the first compound semiconductor epitaxial layer to form a second compound semiconductor epitaxial layer; and applying a second thermal treatment process to complete fabricating a compound semiconductor epitaxial wafer. An independent claim is a compound semiconductor epitaxial wafer comprising: a metal substrate; a first silicon buffer layer, disposed on the metal substrate; a second compound semiconductor buffer layer, disposed on the first silicon buffer layer; a third compound semiconductor buffer layer, disposed on the second compound semiconductor buffer layer, and went through a first thermal treatment process; a first compound semiconductor epitaxial layer, disposed on the third compound semiconductor buffer layer; and a second compound semiconductor epitaxial layer, disposed on the first compound semiconductor epitaxial layer, and went through a second thermal treatment process.
机译:制造化合物半导体外延晶片的步骤包括:在金属基板上沉积硅薄膜;在硅缓冲层上沉积化合物半导体薄膜;结晶化合物半导体薄膜;应用第一热处理工艺;并应用第二热处理工艺。制造化合物半导体外延晶片包括:在金属衬底上沉积硅薄膜以形成第一硅缓冲层;在第一硅缓冲层上沉积化合物半导体薄膜以形成第二化合物半导体缓冲层;在第二化合物半导体缓冲层上沉积化合物半导体薄膜以形成第三化合物半导体缓冲层;在第三化合物半导体缓冲层上使化合物半导体薄膜结晶以形成第一化合物半导体外延层;应用第一热处理工艺;在第一化合物半导体外延层上使化合物半导体薄膜结晶以形成第二化合物半导体外延层;并进行第二热处理工艺以完成化合物半导体外延晶片的制造。一个独立的权利要求是一种化合物半导体外延晶片,包括:金属衬底;和第一硅缓冲层,设置在金属基板上;第二化合物半导体缓冲层,设置在第一硅缓冲层上;第三化合物半导体缓冲层,设置在第二化合物半导体缓冲层上,并经过第一热处理工艺;第一化合物半导体外延层,设置在第三化合物半导体缓冲层上;第二化合物半导体外延层,设置在第一化合物半导体外延层上,并经过第二热处理工艺。

著录项

  • 公开/公告号DE102009001379A1

    专利类型

  • 公开/公告日2010-09-09

    原文格式PDF

  • 申请/专利权人 PACIFIC SPEED LTD.;

    申请/专利号DE20091001379

  • 发明设计人 LIN CHIEN-FENG;

    申请日2009-03-06

  • 分类号C30B25/18;H01L21/205;C30B29/38;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:30

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