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Integrated photoreeeivers with MSM and PIN photodetectors for high frequency applications

机译:使用MSM和PIN光电探测器集成了用于高频应用的PIN光电探测器

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The results of investigation of PIN and MSM photodetectors fabricated in our Semiconductor Device Laboratory are presented. Discrete chips of PIN and MSM photodetectors and similar photodetectors integrated with a MESFET amplifier within a single MMIC chip were tested and compared. The structures were designed for range of wavelengths from 870nm to l000nm. To accomplish this, the In_xGa_(1-x)As absorption layer with appropriate content of indium has been used as an active layer. AH structures have been fabricated using Metal Organic Vapour Phase Epitaxy (MOVPE) growth on GaAs substrates with the use of different buffer and matching layer configuration. I-V and spectral characteristics of the PIN and MSM photodetectors and also MMIC structures with the MSM photodetector were evaluated. Time response to the optical pulse excitation has been measured. All designs were compared from the point of view of their application in the optoelectronic integrated circuits.
机译:提出了在我们的半导体器件实验室中制造的销和MSM光电探测器的研究结果。测试并比较了PIN和MSM光电探测器的离散芯片和与MESFET放大器集成的类似光电探测器进行了比较。该结构被设计用于波长范围为870nm至L000nm。为了实现这一点,in_xga_(1-x)作为铟的适当含量的吸收层已被用作有源层。使用不同的缓冲液和匹配层构型,使用GaAs基材上的金属有机气相外延(MOVPE)生长来制造AH结构。评估销和MSM光电探测器的I-V和光谱特性以及MSM光电探测器的MMIC结构。已经测量了对光学脉冲激励的时间响应。将所有设计与其在光电集成电路中的应用的角度进行比较。

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