首页> 外文会议>European Conference on Chemical Vapour Deposition >Low pressure chemical vapour deposition of crystalline Ga_2Te_3 and Ga_2Se_3 thin films from single source precursors using telluroether and selenoether complexes
【24h】

Low pressure chemical vapour deposition of crystalline Ga_2Te_3 and Ga_2Se_3 thin films from single source precursors using telluroether and selenoether complexes

机译:使用碲和硒醚配合物,从单源前体的低压化学气相沉积结晶Ga_2Te_3和Ga_2Se_3薄膜

获取原文

摘要

Neutral telluro- and seleno-ether complexes of the form [GaCl_3(~nBu_2E)] (E = Se, Te) and [(GaCl_3)_2{nBuE(CH_2)nEnBu}] (E = Se, n = 2; E = Te, n = 3) have been synthesised via a facile, high yielding reaction. These complexes have been shown to be suitable precursors for the low pressure chemical vapour deposition of Ga_2Te_3 and Ga_2Se_3, the first reported example of a telluroether complex being used for the deposition of a metal telluride. The thin films have been characterised by X-ray diffraction, SEM, EDX, Raman and Hall measurements. The films are crystalline, have good, uniform coverage and Raman spectra match literature values. Hall measurements show that the thin films are p-type semiconductors. Competitive deposition of Ga_2Te_3 onto photolithographically patterned SiO_2/TiN substrates shows a preference for deposition onto TiN.
机译:形式[gacl_3(〜nbu_2e)](e = se,te)和[(gacl_3)_2 {nbue(ch_2)nenbu}](e = se,n = 2; e =的中性碲和eleno-醚络合物TE,N = 3)通过容易,高产反应合成。已经显示出这些配合物是Ga_2Te_3和Ga_2Se_3的低压化学气相沉积的合适前体,其用于沉积金属碲化物的碲醚络合物的第一个报道的实施例。薄膜的特征在于X射线衍射,SEM,EDX,拉曼和霍尔测量。薄膜是晶体,具有良好,均匀的覆盖和拉曼光谱匹配文献值。霍尔测量表明,薄膜是p型半导体。 Ga_2te_3对光刻图案化的SiO_2 / TiN基材的竞争沉积显示出沉积到锡上的偏好。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号