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Improved Electroluminescence In Organic Light Emitting Diodes By Thermal Annealing Of Indium Tin Oxide Anode

机译:通过氧化铟锡阳极的热退火改善有机发光二极管中的电致发光

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We demonstrate the improved electroluminescence (EL) in OLEDs by using annealed ITO anode at different temperatures under the normal ambient. SEM studies show the smooth surface morphology of ITO film upto 300°C and it turned wrinkle kind of structure at 400°C. The hole-only device (HOD) based on ITO annealed at 300°C exhibits the higher hole-current density when compared to pristine ITO based device and it is drastically decreased for 400°C. The higher EL emission intensity was observed for OLEDs using ITO annealed at 300°C and it is drastically decreased for 400°C annealed ITO based device. These results show that the annealing of ITO anode upto 300°C improves the holeinjection in OLEDs, balancing the charge carriers and improving the device performance, whereas the change in surface properties of ITO anode annealed at 400°C in turn alters the ITO/TPD interface leading to the charge imbalance, resulting in the decreased device performances.
机译:我们通过在正常环境下的不同温度下使用退火ITO阳极来证明OLED中的改进的电致发光(EL)。 SEM研究表明,ITO薄膜的光滑表面形貌,高达300°C,它在400°C下转动皱纹结构。基于ITO在300℃下退火的仅电孔装置(HOD)在与原始ITO基于基于ITO的装置相比时呈现更高的孔电流密度,并且它在400℃下急剧下降。使用ITO在300℃下退火的OLED观察到较高的EL发射强度,并且对于基于400°C退火的ITO的装置,其急剧下降。这些结果表明,ITO阳极的退火高达300°C改善了OLED中的孔隙,平衡了电荷载流子并改善了装置性能,而ITO阳极的表面性质的变化反转改变ITO / TPD导致充电不平衡的界面,导致设备性能降低。

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