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Optimization of DIO_3 with Megasonic Cleaning of Ru Capped EUVL Mask for Effective Carbon Contaminant Removal

机译:用ru升压ru覆盖EUVL掩模的DIO_3优化,用于有效碳污染物去除

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A possible candidate for carbon contaminant removal in Ru capped EUVL mask is ozone dissolved water (DIO_3). However, the use of DIO_3 leaves reflectivity loss and serious surface damages on Ru capping layer caused by its high oxidation potential. In this study, an optimum DIO_3 cleaning condition for effective carbon cleaning without surface damage was investigated both theoretically and experimentally. The effect of additive gases such as O_2, CO_2 and N_2 of various concentrations were tried during DIO_3 generation for oxidation stability on Ru capping layer and N_2 added 15 ppm DIO_3 was found to be the best condition. However carbon contaminant was ineffectively removed at this condition. Thus megasonic is irradiated during DIO_3 process and the results show that carbon is not only completely removed in a shorter time but also lower reflectivity loss was accomplished with minimal increase in the surface roughness.
机译:Ru覆盖Euv1掩模中的碳污染物去除可能的候选候选物是臭氧溶解的水(DIO_3)。然而,通过高氧化潜力引起的Ru覆盖层的使用DIO_3留下反射率损失和严重表面损坏。在本研究中,理论上和实验在没有表面损坏的情况下,在没有表面损坏的情况下进行有效碳清洁的最佳DIO_3清洁条件。在Ru覆盖层上的氧化稳定性的DIO_3生成期间尝试了附加气体如O_2,CO_2和N_2的效果,并发现N_2添加15ppm DIO_3是最佳状态。然而,在这种情况下无效地除去碳污染物。因此,在DIO_3过程中照射兆元,结果表明,碳不仅在较短的时间内完全除去,而且在表面粗糙度的最小增加中实现了更低的反射率损失。

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