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Electrochemical Impedance Spectroscopy (EIS) Analysis of BTA Removal by TMAH during Post Cu CMP Cleaning Process

机译:TMAH在CU CMP清洗过程中,电化学阻抗光谱(EIS)分析TMAH的分析

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In the present study, the efficiency of TMAH in removing BTA organic layer from Cu surface is evaluated through electrochemical impedance spectroscopy studies. As the conventional EIS measurements could not be applied in situ to study the cleaning system, a modified EIS experimental procedure is adopted in the present work. The impedance data is validated by Kramers Kronig transform (KKT) and modeled by electrical equivalent circuit (EEC) model. Contact angle measurements were also conducted to complement the studies. The results show that a minimum concentration of 0.5 wt % TMAH is required for complete removal of BTA from the Cu surface.
机译:在本研究中,通过电化学阻抗光谱研究评估TMAH在从Cu表面除去BTA有机层的效率。由于传统的EIS测量不能原位应用研究清洁系统,在本作中采用改性的EIS实验程序。阻抗数据由Kramers Kronig变换(KKT)验证,并由电气等效电路(EEC)模型建模。还进行了接触角测量以补充研究。结果表明,从Cu表面完全除去BTA所需的最小浓度为0.5wt%Tmah。

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