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Interaction of multiple delaminations and die in a plastic IC package

机译:多个分层和模具在塑料IC包中的相互作用

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To lend more confidence to the engineers adopting the fracture mechanics approach in the study of delamination in IC packages, a series of studies is performed to investigate the interactions of multiple delaminations and the impact of the die edge. Finite element models are constructed and the energy release rate (ERR) of the crack tips calculated using the virtual crack closure method and J-integral. Since the fracture toughness of the interface is dependent on the mode mixity, the mode mixity of the crack tips will be calculated using a method based on the modified virtual crack closure method. The vehicle of study is a plastic quad flat pack (PQFP) and the interface of interest is the pad/encapsulant interface. The interaction of up to 3 delaminations is studied. It is found that for a single long edge delamination, the ERR will peak in the vicinity of the die. As for delamination of identical sizes at different locations, the edge delamination will result in the highest ERR. Hence, in the choice of delaminations to be included in the multiple delamination analyses, the edge delamination is always included (named crack#1) and the other delaminations (crack#2 and crack#3) lie in the vicinity of the die edge. All the delaminations are assumed to be of the same length. In the analyses involving 2 delaminations of length 0.2 mm, it is found that the effect caused by two interacting delaminations is insignificant, the amplification of ERR and the change in phase angle are less than 10%. However, when the length of the 2 delaminations is increased to 0.482 mm, significant amplification effect is observed. With the presence of 3 delaminations of equal lengths, the presence of crack#2 and crack#3 has less effect on the ERR of the crack#1 whereas the impact of crack#1 and crack#3 on crack#2 is more significant. Generally, the presence of more than 1 delamination will aggravate the crack situation as the amplification effect on ERR is evident especially for longer delamin- - ations and the phase angle remains relatively less significant. Besides, it is found that amount of amplification increases with an increase in the number of delaminations at the interface and length of the interacting delaminations while it decreases with distance between the delaminations.
机译:为了对工程师提供更多信心,采用裂缝力学方法在IC封装中的分层研究中,进行了一系列研究以研究多分层的相互作用和模具边缘的影响。使用虚拟裂纹闭合方法和J-Integral计算的裂缝提示的构造和能量释放速率(ERR)构成有限元模型。由于界面的断裂韧性取决于模式混合,因此使用基于修改的虚拟裂纹闭合方法的方法来计算裂缝提示的模式混频。学习车辆是塑料四边形扁平包(PQFP),其界面是垫/密封界面。研究了多达3分层的相互作用。结果发现,对于单个长边分层,误差将在模具附近达到峰值。至于在不同位置的相同尺寸的分层,边缘分层将导致最高的错误。因此,在选择多分层分析中的分层中,始终包括边缘分层(命名裂缝#1)和其他分层(裂缝#2和裂缝#3)位于模具边缘附近。所有分层都被认为是相同的长度。在涉及长度0.2mm的2分层的分析中,发现由两个相互作用分层引起的效果是微不足道的,误差的扩增和相角的变化小于10%。然而,当2分层的长度增加至0.482mm时,观察到显着的放大效果。随着3分层的相等长度的存在,裂缝#2和裂缝#3的存在对裂缝#1的错误影响较小,而裂缝#1和裂缝#3对裂缝#2的影响更为显着。通常,随着对ERR的扩增效果显而易见的,存在超过1分层的存在,特别是对于较长的分层,相角保持相对不太显着。此外,发现放大量随着界面处的分层数量的增加和交互分层的长度而增加,而在分层之间的距离减小。

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