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EFFECTS OF 6 MeV ELECTRON IRRADIATION ON PHOTOLUMINESCENCE OF HIGH-QUALITY CuInSe_2 SINGLE CRYSTALS

机译:6 MeV电子照射对高质量Cuinse_2单晶光致发光的影响

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High-quality single crystals of CuInSe_2 with near-stoichiometric elemental compositions, grown by the Bridgman method, were irradiated by 6 MeV electrons with doses from 5·10~(15) to 10~(18) cm~(-2). The crystals were studied before and after irradiation using photoluminescence (PL) at a temperature of 4.2 K. The PL spectra, measured before the irradiation, reveal a number of sharp and well resolved lines associated with free-and bound-excitons. The lower energy region of the spectra also reveals broader peaks related to band-impurity, donor-acceptor pair recombination and their phonon replicas. The irradiation resulted in a reduction of the intensity of the free- and bound-excitons observed in the non-implanted material. Such a reduction is observed for quite low doses of 5·10~(15) cm~(-2). Irradiation also induces new sharp PL lines W1 at 1.03, W_2 at 1.01 eV and W_3 eV at 0.99 eV below the free-exciton emission. Two deeper broad bands, associated earlier with the acceptor-type defects, interstitial selenium (Se_i) and copper on indium site (Cu_(In)), have become more intense suggesting an increase in the concentration of these defects due to irradiation.
机译:CuInSe_2的高品质单晶与接近化学计量的元素组成,通过布里奇曼法生长,是由6兆层电子伏的电子从5·10〜(15)10〜(18)厘米〜(-2)照射剂量。将晶体前和4.2 K的PL光谱的温度,照射前测得的使用照射光致发光(PL)之后进行了研究,揭示许多具有自由和结合的-激子相关联的锋利和良好分辨的线。光谱的较低能量区域也揭示了有关带杂质,供体 - 受体对重组和他们的声子复制品更宽的峰。照射导致的降低在非植入的材料中观察到的自由和结合的-激子的强度。这样的减小,观察到相当低剂量的5·10〜(15)厘米〜(-2)。照射也诱导新尖锐PL线W_2 W1在1.03,在1.01 eV和W_3电子伏特的自由激子发射低于0.99电子伏特。两个更深宽条带,与之前受主型缺陷有关,间质性硒(Se_i)和铜铟位点(CU_(In)的),都由于照射变得更加强烈暗示在这些缺陷的浓度的增加。

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