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Nanostructure and magnetic properties of highly (001) oriented L1_0 (Fe_(49)Pt_(51))_(1-x)Cu_x films

机译:高度(001)取向L1_0(Fe_(49)Pt_(51))_(1-x)Cu_x薄膜的纳米结构和磁性

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We report on nonepitaxially grown L1_0 Cu-alloyed FePt thin films with strong (001) texture. The FePt films with different Cu contents were deposited directly on Si wafers with a Fe_(49)Pt_(51)/Cu multilayer structure. The Cu content was varied from 0 to 13 at. percent. All films were annealed at 600 deg C for 5 min. X-ray-diffraction characterization showed that only one set of L1_0 diffraction peaks appeared and no elemental Cu diffraction peaks were visible. This result, along with a varying c/a lattice-parameter ratio, suggests that Cu substitutes Fe or Pt in the L1_0 lattice and ternary FePtCu alloy films are formed. (001) texture was enhanced with the increase of Cu content. Transmission electron microscope images showed that the grain size of FePtCu was about 10 mn. For FePt film with 11 at. percent Cu substitution, coercivity was about 5 kOe, which is suitable for writing in a practical perpendicular-recording film.
机译:我们报告了具有强(001)纹理的不关节生长的L1_0 Cu合金缩薄薄膜。用FE_(49)Pt_(51)/ Cu多层结构直接在Si晶片上直接沉积具有不同Cu内容物的备用膜。 Cu含量从0到13变化。百分。所有薄膜在600℃下退火5分钟。 X射线 - 衍射表征显示,仅出现一组L1_0衍射峰,并且不可见元素Cu衍射峰。该结果以及改变的C /晶格参数比表明,Cu代替L1_0晶格中的Fe或Pt,形成了三元菌属合金膜。 (001)随着Cu含量的增加而增强了纹理。透射电子显微镜图像显示Feptcu的晶粒尺寸约为10mL。对于11 at的备用电影。百分比Cu取代,矫顽力为约5ko,适用于在实际的垂直记录膜中写入。

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