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Influence of Irradiation on Excess Currents in SiC pn Structures

机译:辐照对SiC PN结构过度电流的影响

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Excess currents of the different nature in 6H-SiC pn structures of the different origin and parameters were investigated. The effect of the suppression of the forward and reverse excess currents were observed after 0.9 MeV electron (dose 5Xl0~(16) ÷ 1.6X10~(17) cm~(-2)) and 8 MeV proton (dose 5Xl0~(15) cm~(-2)) irradiation for structures with shunts which is probably due to the presence of relatively small inhomogeneities. The shunts in another group of pn structures probably are more high capability and they are more stable against degradation during irradiation.
机译:研究了不同起源和参数的6H-SiC PN结构中不同性质的过量电流。在0.9meV电子(剂量5xL0〜(16)℃1.6x10〜(17)cm〜(-2))和8mev质子(剂量5xl0〜(15)后观察到前向和反向过量电流的效果CM〜(-2))用分流器的结构照射,这可能是由于相对小的不均匀性的存在。另一组PN结构中的分流可能是更高的能力,并且在照射期间,它们更稳定地降解。

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