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Multi-Step Supervisory Control of Flash Memory Device Production Via a Simple First-Principles Model

机译:通过简单的第一原理模型进行闪存设备生产的多步监控

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The goal of this paper is to extend a framework of process automation that has been successful in the chemical process industry to a semiconductor manufacturing process. A simple physics model of a flash memory cell is presented, and a multi-step supervisory control strategy is simulated on a flash memory cell manufacturing process based on this model. The multi-step supervisory control strategy performs multiple optimizations of target inputs for a lot in the course of its processing. The proposed strategy is shown to confer a significant improvement in the regulation of product quality over a one-step supervisory control strategy and an open loop implementation. This improvement is primarily due to the ability of the optimizer to compensate for the effect of error introduced by step controllers.
机译:本文的目标是扩展一个过程自动化框架,该框架已经成功地在化学工艺行业到半导体制造过程。提出了一种简单的闪存单元物理模型,并在基于该模型的闪存单元制造过程中模拟了多步监控策略。在处理过程中,多步监控策略在很多过程中对目标输入执行多个优化。拟议的策略显示在一步监督控制策略和开放环路实施方面赋予产品质量的调控有重大改进。这种改进主要是由于优化器能够补偿步进控制器引入的误差的效果。

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