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HIGH-VOLTAGE SUPER-JUNCTION SOI-LDMOSFETS WITH REDUCED DRIFT LENGTH

机译:具有减小的漂移长度的高压超结SOI-LDMOSFET

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We describe high-voltage super-junction SOI-LDMOSFETs which have a trench oxide in the drift region. The super-junction helps to increase the effective drift doping. The trench oxide in the drift region allows to reduce the drift length without degrading the breakdown voltage. With the proposed device structure a reduction of the on-resistance of the n-drift layer can be achieved. The breakdown voltage and the specific on-resistance of the suggested devices as a function of the trench oxide depth, the p-column width, and the doping are studied. Using the two-dimensional numerical simulator MINIMOS-NT, we confirm that the specific on-resistance of the device proposed is lower than that of conventional SOI-LDMOSFETs, and the drift length is reduced to 65% compared to conventional devices.
机译:我们描述了在漂移区域中具有沟槽氧化物的高压超结SOI-LDMOSFET。超级连接有助于增加有效的漂移掺杂。漂移区域中的沟槽氧化物允许减小漂移长度而不会降低击穿电压。利用所提出的装置结构,可以实现N漂移层的导通电阻的降低。研究了所建议装置的击穿电压和特定导通电阻作为沟槽氧化物深度,P柱宽度和掺杂的函数。使用二维数值模拟器最小-NT,我们确认所提出的设备的具体导通电阻低于传统的SOI-LDMOSFET,并且与传统装置相比,漂移长度降低至65%。

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