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HIGH-VOLTAGE SUPER-JUNCTION SOI-LDMOSFETS WITH REDUCED DRIFT LENGTH

机译:减小漂移长度的高压超结SOI-LDMOSFET

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摘要

We describe high-voltage super-junction SOI-LDMOSFETs which have a trench oxide in the drift region. The super-junction helps to increase the effective drift doping. The trench oxide in the drift region allows to reduce the drift length without degrading the breakdown voltage. With the proposed device structure a reduction of the on-resistance of the n-drift layer can be achieved. The breakdown voltage and the specific on-resistance of the suggested devices as a function of the trench oxide depth, the p-column width, and the doping are studied. Using the two-dimensional numerical simulator MINIMOS-NT, we confirm that the specific on-resistance of the device proposed is lower than that of conventional SOI-LDMOSFETs, and the drift length is reduced to 65% compared to conventional devices.
机译:我们描述了在漂移区中具有沟槽氧化物的高压超结SOI-LDMOSFET。超级结有助于增加有效的漂移掺杂。漂移区中的沟槽氧化物允许减小漂移长度而不会降低击穿电压。利用所提出的器件结构,可以减小n漂移层的导通电阻。研究了所建议的器件的击穿电压和比导通电阻与沟槽氧化物深度,p列宽度和掺杂量的关系。使用二维数值仿真器MINIMOS-NT,我们确认了所提出器件的比导通电阻比常规SOI-LDMOSFET低,并且漂移长度与常规器件相比降低了65%。

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